Ellipsometry is an optical technique that measures changes in the polarization of light and through a subsequent data analysis give data on the thickness, dry mass and refractive index of an adsorbed layer. The applications are plentyfold when studying polymers, proteins, biofilms, surface modifications etc. Ellipsometry is often combined with Atomic Force Microscopy and QCM (Quartz Crystal Microbalance).

The applications can be briefly exemplified as follows: Adsorption and desorption; Conformational changes and Rheological changes