Atomic force microscopy (AFM) is a very high-resolution type of microscopy with Ångström resolution on certain samples. A tip as sharp as one molecule is scanned over the surface. Forces between the tip and the surface result in deflections of the cantilever and these deflections are monitored through a laser beam. We use AFM in combination with foremost ellipsometry and QCM but also in combination with more available instruments such as ATR-FTIR to image and measure changes on a surface at a nanoscale.